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Conference Papers Year : 2007

Compact, high performance femtosecond laser ablation system for trace element analysis

Abstract

We present a compact, industrial laser ablation system for trace element analysis. The system uses a high repetition rate femtosecond laser for material ablation and an inductively coupled mass spectrometer for analysis. © 2007 Optical Society of America.
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Dates and versions

hal-01590325 , version 1 (19-09-2017)

Identifiers

  • HAL Id : hal-01590325 , version 1

Cite

E. Mottay, P. Chabassier, Christophe Pécheyran, Fanny Claverie, Olivier François Xavier Donard. Compact, high performance femtosecond laser ablation system for trace element analysis. Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies, May 2007, Baltimore, United States. ⟨hal-01590325⟩
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