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SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications

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hal-03666275 , version 1 (12-05-2022)

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  • HAL Id : hal-03666275 , version 1

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Eric Brune, Jean-Marie Larbaig, Laurent Pecastaing, Thierry Reess, Antoine Silvestre de Ferron, et al.. SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications. 49th International Conference on Plasma Science (ICOPS 2022), May 2022, Seattle, Washington, United States. ⟨hal-03666275⟩

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CEA UNIV-PAU SIAME
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