SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications

Eric Brune (1) , Jean-Marie Larbaig (1) , Laurent Pecastaing (1) , Thierry Reess (1) , Antoine Silvestre de Ferron (1) , Marc Rivaletto (1) , R. Ruscassie (1) , Veronika Gavrilenko (1) , Baptiste Cadilhon (2) , Laurent Courtois (2) , Bruno Cassany (2) , Alexandre Goeury (2)

1 SIAME - Laboratoire des Sciences de l'Ingénieur Appliquées à la Mécanique et au génie Electrique
2 CEA CESTA - CEA/CESTA - Centre d'études scientifiques et techniques d'Aquitaine

Domains: Engineering Sciences [physics]; Electric power; Engineering Sciences [physics]; Electronics; Engineering Sciences [physics]; Chemical and Process Engineering

Eric Brune, Jean-Marie Larbaig, Laurent Pecastaing, Thierry Reess, Antoine Silvestre de Ferron, et al.. SiC Mosfet Characterization For Series Parallel Combination in multi-pulse radiography Applications. 49th International Conference on Plasma Science (ICOPS 2022), May 2022, Seattle, Washington, United States. ⟨hal-03666275⟩