Erwin Franquet, Stéphane Gibout, Jean-Pierre Bedecarrats, Didier Haillot, Jean-Pierre Dumas. Application of PCM characterization,.
12th Experts meeting of the joined 42/29 tasks of the SHC and ECES program of the IEA, October 8-10th 2014, Nagoya, Japon., 2014, Nagoya, Japan.
⟨hal-02162994⟩