Differentiated contrasts for M1/4TiS2 (M = Fe, Ni) UHV-STM images

Hervé Martinez (1) , Michel Loudet (1)

1 IPREM - Institut des sciences analytiques et de physico-chimie pour l'environnement et les materiaux

The specific crystallographic features of M1/4TiS2 (M = Ni, Fe) lead us to carry out UHV-Scanning Tunneling Microscopy studies, in order to bring the different atoms chemical environment of the structure and the host-guest interactions to light. We imaged the top sulfur planes (001) for both compounds and proposed an explanation to the two well differentiated contrast observed and a surface structural arrangement. S2p XPS core spectra were recorded to highlight the different chemical surrounding for chalcogen atoms and their differentiation depending of the compound considered (Ni or Fe1/4TiS2).

Mots clés: Chalcogenides; Crystal atomic structure; Crystal orientation; Intercalation compounds; Iron compounds; Nickel compounds; Scanning tunneling microscopy; Sulfur; Surface structure; X ray photoelectron spectroscopy

Domaines: Chimie; Matériaux

Hervé Martinez, Michel Loudet. Differentiated contrasts for M1/4TiS2 (M = Fe, Ni) UHV-STM images. Applied Surface Science, 2000, 167 (3), pp.160-168. ⟨10.1016/S0169-4332(00)00439-6⟩. ⟨hal-01503989⟩